20 Sept 2016

Bruker’s Nano Surfaces Division today announced the release of scanning electrochemical microscopy (SECM) capability for its Dimension Icon® atomic force microscope (AFM) platform. Utilizing a proprietary probe design, Bruker’s new PeakForce SECM™ mode controls nanoelectrode tip position and tip-sample interaction with unprecedented precision to provide simultaneous capture of topographical, electrochemical, electrical, and mechanical maps. This capability provides access to previously unobtainable nanoscale observation of redox reactions and their kinetics. Now researchers are able to address vital evolution of materials for energy, environment, and biochemical sensors.

“Our customers have been consistently imaging at very high resolution with the new nanoelectrodes on the Dimension Icon AFM,” said Teddy Huang, Ph.D., Senior Applications Scientist at Bruker Nano Surfaces Division. “For the first time they are able to capture electrochemistry correlated with nanomechanical information to understand the complex relationship between size, geometry, modulus, adhesion, and activity of nanostructured materials.”
“PeakForce SECM radically redefines what is possible in the nanoscale visualization of electrical and chemical processes in liquid,” added Marco Tortonese, Ph.D., Vice President and General Manager of Bruker’s AFM Instrumentation Business. “This breakthrough is the result of the continuing evolution of PeakForce Tapping® technology combined with our in-house design and manufacture of reliable commercial probes.”